TEM Course: Master Theory & Applications | IIT Hyderabad
Course Details
| Exam Registration | 148 |
|---|---|
| Course Status | Ongoing |
| Course Type | Core |
| Language | English |
| Duration | 12 weeks |
| Categories | Metallurgy and Material science & Mining Engineering, Multidisciplinary, Physics, Chemistry, Materials Characterization |
| Credit Points | 3 |
| Level | Undergraduate/Postgraduate |
| Start Date | 19 Jan 2026 |
| End Date | 10 Apr 2026 |
| Enrollment Ends | 02 Feb 2026 |
| Exam Registration Ends | 20 Feb 2026 |
| Exam Date | 17 Apr 2026 IST |
| NCrF Level | 4.5 — 8.0 |
Master the Nanoscale: A Comprehensive Guide to Transmission Electron Microscopy
Transmission Electron Microscopy (TEM) stands as one of the most powerful tools for materials characterization, allowing scientists and engineers to peer into the atomic structure of matter. For students and professionals in materials science, physics, chemistry, and related fields, a deep understanding of TEM is no longer a luxury—it's a necessity. This detailed blog outlines a structured 12-week course designed to take you from the fundamental theory of TEM imaging to its most advanced, cutting-edge applications.
Course Overview: Your Pathway to TEM Expertise
This intensive course, led by Prof. Sai Rama Krishna Malladi of IIT Hyderabad, is meticulously crafted to build a strong conceptual foundation before moving into practical demonstrations and advanced techniques. Spanning 12 weeks, it is ideal for final-year undergraduates, Masters, and PhD students seeking to harness the full power of electron microscopy in their research.
Meet Your Instructor: Prof. Sai Rama Krishna Malladi
Prof. Sairam brings a wealth of expertise to this course. Since joining the Department of Materials Science and Metallurgical Engineering at IIT Hyderabad in 2017, his research has focused on pushing the boundaries of what's possible with TEM. After obtaining his PhD from the Technische Universiteit Delft, Netherlands, where he worked on developing advanced specimen holders, his current research is centered on imaging through liquids and developing novel in-situ microscopy techniques. His practical experience in technique development ensures the course content is both rigorous and highly relevant to contemporary research challenges.
Who Should Enroll?
- Intended Audience: Final year undergraduates, Masters, and PhD students from Materials & Metallurgical Engineering, Chemistry, Physics, and related disciplines.
- Prerequisites: A basic introduction to Solid State Physics, Crystallography, or Physical Metallurgy is beneficial but not mandatory. The course builds concepts from the ground up.
- Industry Support: This course is recognized by industry leaders like JEOL, who are establishing a microscopy training school at IIT Hyderabad, highlighting the practical value of the curriculum.
Detailed 12-Week Course Layout
| Week | Topics Covered |
|---|---|
| Week 1 | Introduction to Imaging techniques; Fundamentals of Imaging Theory |
| Week 2 | Waves & Scattering; Foundations of Imaging Principles; Lens Aberrations in TEM |
| Week 3 | Imaging in TEM; Microscope Construction, Components & Working Principles |
| Week 4 | Scattering & Diffraction Theory; Electron Diffraction Techniques |
| Week 5 | Practical Demo: Electron Diffraction, Tilting, Pattern Acquisition, Unit Cell Reconstruction |
| Week 6 | Theory of Imaging Modes: Bright Field, Dark Field, High-Resolution TEM (HRTEM) |
| Week 7 | Practical Demonstration of Imaging Modes: Bright Field, Dark Field, HRTEM |
| Week 8 | Theory of Scanning TEM (STEM) Techniques |
| Week 9 | Practical Demo of STEM Techniques: Imaging, Mapping, and Analysis |
| Week 10 | Analytical TEM Techniques: Energy-Dispersive X-ray Spectroscopy (EDS) & Electron Energy Loss Spectroscopy (EELS) |
| Week 11 | Recent Advances: In-situ Electron Microscopy (Heating, Cooling, Electrical Biasing) |
| Week 12 | Recent Advances: S/TEM-based Phase Imaging Techniques (e.g., ptychography) |
Essential Learning Resources
The course is supported by seminal textbooks in the field, providing students with authoritative references for deeper study:
- Carter, C. Barry, and David B. Williams, eds. Transmission electron microscopy: Diffraction, imaging, and spectrometry. Springer, 2016.
- Williams, David B., et al. The transmission electron microscope. Springer Us, 1996.
- Hawkes, Peter W., and John CH Spence, eds. Springer handbook of microscopy. Springer Nature, 2019.
- Buseck, Peter, John Cowley, and LeRoy Eyring, eds. High-resolution transmission electron microscopy: and associated techniques. Oxford University Press, 1989.
Why This Course is Essential for Your Career
In today's research and industrial landscape, proficiency in advanced characterization tools like TEM is a critical skill. This course offers a unique blend of theoretical depth and practical insight, moving beyond button-pushing to foster a true understanding of image formation and interpretation. Whether you aim to characterize novel nanomaterials, understand metallurgical failures, or explore biological structures, the skills imparted in this course will be invaluable. By covering everything from basic diffraction to state-of-the-art in-situ and phase imaging techniques, it prepares you not just to use a TEM, but to innovate with it.
Embark on this 12-week journey to transform from a novice to a knowledgeable practitioner, ready to leverage Transmission Electron Microscopy to unlock the secrets of materials at the atomic scale.
Enroll Now →